Semiconductor Test data analysis software

 

Reduce test cost and test cost optimization

 

Trisoft Technologies announces semiconductor data test analysis software ( Yield Power ) to reduce cost of test in high-mix production environments
To give you a competitive edge, Yield Power designed to reduce test cost. It will provide you the best test cost optimization.
  • Reduce test costs per component up to 25%
  • Downsize all cost of test factors for best test cost optimization:
  • uncertainty, downtime, engineering effort,
  • asset costs
  • Optimize test strategies for test cost optimization.

The test cost optimization is a great challenge in the today's market. Yield Power ( semiconductor, memory test and integrated test data analysis software enables you to reduce cost of test to get to secure your leading position in the market!

There is only one valid definition for test-cost per product: "total cost of test divided by the number of good products".
Yield Power is a test system optimized to cost-effectively test a wide range of semiconductor data, memory test and integrated test, with a flexible architecture. Yield power provides the best test cost optimization for memory test and integrated test. Quality performs main role in the today's market to survive and to be on top. To maintain the quality with semiconductor data and memory test and integrated test is very costly. But if you reduce cost of test, it may be decrease your quality. Yield Power is the best software which provides you the test cost optimization in memory test and you can reduce cost of test with the quality. Yield power reduces cost of test by performing many statistical analyses in minutes. The Yield Power is ideal for mid-volume, high-mix memory and logic production environments to perform semiconductor data, memory test and integrated test.

Contract manufacturers that produce memory and semiconductor devices are challenged reduce cost of test for a constantly changing mix of devices. The Yield Power addresses this challenge with many of statistical analysis that enables users to test a wide range of memory and semiconductor data. You need to upload the STDF files once in the system for test cost optimization.