Semiconductor Test data analysis software

 

 

Product


Yield power ( semiconductor yield management software ) is designed for collaborative data aggregation and management, analysis, and reporting. It is developed to address the data analysis needs of the semiconductor industry.

Yield power is a web-based, interactive, easy to use, data analysis solution for Fabless semiconductor companies. Yield power provides operations managers, and product and test engineers the ability to quickly identify and resolve issues encountered in manufacturing, and quickly turnaround those problem situations, enhancing efficiency, and enabling you to be the first to market at high volume.

Yield power ( semiconductor yield management software ) accelerates your ability to analyze data, ensuring your time to market stays within range. Yield power provides a secure way to aggregate data from geographically diverse sources into the Yield power Database, and automates the management of this data, Yield Power helping you analyze data to solve design and manufacturing problems, and helping you efficiently identify and resolve product and yield-related problems when you are in volume manufacturing.

  • All data automatically loaded
  • All STDF files data is automatically summarized for semiconductor yield management.
  • Analysis shows the distribution of tests and parts passing or failing
  • Correlate test parameters to in-line, PCM, and wafer sort parametric results
  • Correlate parameters to operating conditions

Yield power ( semiconductor yield management software )is a comprehensive data management, reporting, and collaboration system that monitors all manufacturing data sources and automatically identifies problem areas and potential root causes. It provides powerful reports and analysis that allows you to "surf" manufacturing data from multiple foundry, sort, and test suppliers. This ensures immediate access to Yield, EIP, E-Test ( PCM ), Inline, Wafer Sort, and Final Test data for semiconductor yield management software.

Promotes uniform interpretation of data Enhanced collaboration both in-house and with manufacturing partners Supports upload files from external sources such as Excel, IE, Word, PowerPoint Archives reports for long-term storage.

Collaborating with manufacturing partners, such as foundry or assembly/test house partners, is time consuming and even adversarial at times. Yield power ( semiconductor yield management software ) allows for efficient collaboration internally, and with manufacturing partners through joint access to Data, to quickly resolve issues that may arise in production.

Automatically sweep, cleanse, and load all manufacturing data Alert the product engineer of out-of-spec PCM or Sort parameters
Correlate between operation, lot, wafer, die, site, part, or pin-level data Identify lots and parameters that differ from target operating conditions for semiconductor yield management software


Overview

Flexible Data Import
Start your semiconductor data analysis by either uploading a test data file to the Yield Power ( Semiconductor Yield Analysis Software ) database for functional test and semiconductor characterization, or by manually entering test data for Statistical analysis. File formats such as STDF, ATDF, and Excel may be opened directly in Yield Power for semiconductor data analysis, and other files such as comma separated value ( CSV ), and other text delimited files can be imported through the flexible data import facility. Upload STDF, ATDF, CSV files just in one click. You need to upload the STDF, ATDF files once in Yield Power then you can modify the already uploaded STDF, ATDF files data for further Statistical analysis. This functionality provides the test time reduction and test cost optimization. View the Semiconductor data uploaded through STDF files before performing statistical calculations for your semiconductor data analysis. Yield Power allows unlimited SDTF and ATDF files to be uploaded.

Data Customization
Edit your semiconductor test data once it is in the Yield Power Database. Yield Power automatically defines Outliers ( calculated according to the Tukey Method ) in a bright Red Color for the uploaded STDF files for semiconductor data analysis. You can add, edit and delete any test data label. You can also mark any item as an Outlier and can unmark any Outlier as normal field manually for your semiconductor test data analysis. You can also mark fields as outliers while viewing the test data reports. When you mark any fields
as an outlier, that field is not calculated in the in the final statistical analysis and semiconductor characterization.

Versatile Histograms
Create histograms quickly and easily for semiconductor yield management using entire data columns or just a selection of your data for semiconductor data analysis with Yield Power ( Semiconductor Yield Analysis Software ). You have the ability to set different parameters to create Histogram for your semiconductor data analysis and semiconductor characterization. This will help you for different parameter testing. Semiconductor Test Data can be spread across multiple files and seamlessly integrated into one powerful histogram to best explain your statistical analysis. Histogram is the best source to view your statistical analysis like Mean, Median, Sigma, range, Cp, CPK and yield graphically.

You can compare Mean, Median, Sigma, range, Cp, CPK and yield of different labels in a histogram with Yield power ( Semiconductor Yield Analysis Software ). You can compare Mean, Median, Sigma, range, Cp, CPK and yield of different Histograms. This functionality allows you to easily understand the distribution of Mean, Median, Sigma, range, Cp, CPK and yield with graphically interface. Yield power can creates Histogram in few clicks after uploading the STDF files.

Complete Control over Data
Yield Power ( Semiconductor Yield Analysis Software ) provides flexibility to control data form uploading the STDF files to Test data Reports ( TDR ) for semiconductor data analysis with test limits. Yield Power has the Key features like, View uploaded STDF and ATDF files data, Modify already uploaded STDF and ATDF files data, Search test data, Mark unmark Outliers and Linking of labels with parameters. The data control helps for semiconductor characterization
.
To customize every detail of your histogram, you can manipulate semiconductor test data from different files, and compare data of two separate files by linking them. You can compare any Parameter against any section for semiconductor data analysis.

Report Templates
Yield Power ( Semiconductor Yield Analysis Software ) allows you to create different TDR templates to easily understand the digital semiconductor test analysis. You can define mean and Sigma as sub sections for all non-Cpk type sections for specific semiconductor data analysis.

You can define unlimited sections and sub sections for each template to view statistical analysis in Yield Power

So create your own Report Templates ( TDR ) with Customer Specifications and Report and Graphing descriptions. Save Report Templates to reuse with repetitive data sets for a consistent semiconductor data management. This eliminates the hassle of creating Report Templates every time your data changes.

Templates help the test engineers in the parameter and parametric testing.

Data Analysis and Data Manipulation
Your can perform statistical analysis on your semiconductor data, including a variety of basic statistics, including of Mean, Median, Sigma, range, Cp, CPK and yield. You can change the data to see the effects of Mean, Median, Sigma, range, Cp, CPK and yield for statistical analysis and histograms, so as to find the optimum data set.

Yield Power ( Semiconductor Yield Analysis Software ) perform all the statistical analysis ( Mean, Median, Sigma, range, Cp, CPK and yield ) automatically after uploading the STDF files. You can modify the STDF data to see the effects of data on of Mean, Median, Sigma, range, Cp, CPK and yield.

Convenient Printing and Report Export
Yield Power ( Semiconductor Yield Analysis Software ) Easily export Test Data Reports ( Yield Power calls them TDRs ) to an HTML format to view or save the semiconductor data analysis.

You can view the Mean, Median, Sigma, range, Cp, CPK and yield values in the TDRs. You can link different TDRS to see the comparison of different STDF,ATDF files data.

Yield Power compares statistical values like Mean, Median, Sigma, range, Cp, CPK and yield to show the semiconductor yield analysis.

Web based reporting is the key feature of Yield Power ( Semiconductor Yield Analysis Software ). Yield Power publishes these TDRs ( semiconductor data analysis ) to your web server, and has them available for online delivery to any of your users through a simple URL.

Benefits

With Yield Power ( Semiconductor data Analysis Software ), the work of uploading semiconductor data from STDF files is automated, and the data analysis results are displayed in a standard format. You can view the data from the Uploaded STDF files and can modify the data. Upload STDF, CSV files just in one click. You need to upload the STDF files once in the Yield Power then you can modify the already uploaded STDF files data for further Semiconductor test. You can upload unlimited SDTF and ATDF files.

In Yield Power the process is simplified enough that you get a "graphical view" and can easily analyze semiconductor data labels.

Yield Power has made generating Test Data Reports ( TDRs ) simpler by creating HTML documents, which can be quickly and easily shared with colleagues around the world

You can view the Mean, Median, Sigma, Mean minus 3 sigma, Mean plus 3 sigma, Mean minus 6 sigma, mean plus 6 sigma, Cp, CPK and yield values in the TDRs. You can link different TDRS to see the comparison of different STDF,ATDF files data. The Yield Power compare statistical values like Mean, Median, Sigma, Mean minus 3 sigma, Mean plus 3 sigma, Mean minus 6 sigma, mean plus 6 sigma, Cp, CPK and yield to show the semiconductor yield analysis.

You can create histograms quickly and easily for semiconductor yield management using entire data columns or just a selection of your data for semiconductor data analysis with Yield power. You have the ability to set different parameters to create Histogram for your semiconductor data analysis. This will help you for different parameter testing. Semiconductor Test Data can be spread across multiple files and seamlessly integrated into one powerful histogram to best explain your Semiconductor test.

A Histogram is the best source to view your Semiconductor test like Mean, Median, Sigma, Cp, CPK and yield graphically. You can compare Mean, Median, Sigma, Mean Cp, CPK and yield of different label in a histogram with Yield power ( Semiconductor data Analysis Software ). You can compare Mean, Median, Sigma, Cp, CPK and yield of different Histograms. This functionality allows you to easily understand the distribution of Mean, Median, Sigma, Cp, CPK and yield with graphically interface. Yield power can creates Histogram in few clicks after uploading the STDF files

Frustration with other Semiconductor Data Analysis/Test Tools
Semiconductor data does import into other applications but it's a real struggle to produce a precise charting of the Semiconductor test for best semiconductor Yield Management.

Learning with other expensive semiconductor analysis packages is not easy. The user has to spend too many hours trying.

Users are reported saying that other semiconductor data analysis packages are not supported and they crash under many platforms.

Technical specifications

Security Management
Yield Power ( Semiconductor test Software ) Admin Tool allows the Administrator to give different security right to different users. Administrator in the Yield Power Admin Tool module can

  • User and Password Level Security
  • Rights of test data files only to assigned test engineers for statistical analysis
  • Rights of Test Data Report only to assigned test engineers for semiconductor yield management.
  • Create different test engineers groups with security profiles and privileges for semiconductor data analysis.

Importing Data from STDF files

  • Upload semiconductor data files in formats such as STDF, STD, Excel, or other comma or tab delimited files directly in the Yield Power ( Semiconductor test Software ) Database.
  • Directly view the semiconductor test data from the Yield Power Database after uploading the STDF, STD files.
  • Import STDF, ADTF files containing up to 32000 columns and unlimited rows.
  • Import Unlimited STDF, STD files in to the Yield Power.
  • Need to upload the STDF, STDfiles once in the Yield Power
  • view the Semiconductor data uploaded through STDF, STD, files before the statistical calculations
  • You can upload STDF, CSV, STD,files just in one click in Yield power

Data Management

  • Yield Power ( Semiconductor test Software ) Mark/Unmark Outliers for statistical calculations/analysis automatically.
    Manually Mark/Unmark Outliers for statistical calculations/analysis
  • Insert new Test data records into existing Test data for statistical analysis
  • Modify Test's data for semiconductor testing
  • Copy labels
  • Type test data directly into the data window
  • Search data against any Test
  • Delete a data record from the any uploaded STDF, STD file
  • Analyze STDF.

Persistent Information

  • The SDTF, STD files are uploaded permanently into the Yield Power ( Semiconductor test Software ), so you can view and manipulate the data any time. You can upload new STDF, STD file and compare test data with existing STDF test data for semiconductor analysis
  • Yield Power provides accurate results for semiconductor Yield Analysis. Comparing of histograms gives the best results to view the variation in Mean, Median, Sigma, Mean minus 3 sigma, Mean plus 3 sigma, Mean minus 6 sigma, mean plus 6 sigma, Cp, CPK and yield

Data Analysis & Manipulation

  • Perform statistical analysis like Mean, Median, Sigma, Mean minus 3 sigma, Mean plus 3 sigma, Mean minus 6 sigma, mean plus 6 sigma, Cp, CPK and yield on the semiconductor data and get the semiconductor test results.
  • Manipulate the data by adding and deleting labels into the already uploaded STDF data files.
  • Compare any Parameter against any section to perform different semiconductor yield test.
  • Change the data to see the effects of Mean, Median, Sigma, Mean minus 3 sigma, Mean plus 3 sigma, Mean minus 6 sigma, mean plus 6 sigma, Cp, CPK and yield for statistical analysis and histograms, so as to find the optimum data set.
  • Yield Power ( Semiconductor test Software ) perform all the statistical analysis ( Mean, Median, Sigma, Mean minus 3 sigma, Mean plus 3 sigma, Mean minus 6 sigma, mean plus 6 sigma, Cp, CPK and yield ) automatically after uploading the STDF files.
  • Unlimited sections and sub sections for each template to view statistical analysis in Yield power

Statistical Calculations

  • Statistical calculations include like Mean, Median, Sigma, Mean minus 3 sigma, Mean plus 3 sigma, Mean minus 6 sigma, mean plus 6 sigma, Cp, CPK and yield , etc.
  • Mark any filed as outlier, that filed is not calculated in the in the final statistical analysis.
  • Yield Power ( Semiconductor test Software ) calculate Mean, Median, Sigma, Mean minus 3 sigma, Mean plus 3 sigma, Mean minus 6 sigma, mean plus 6 sigma, Cp, CPK and yield values automatically after uploading the STDF files.

Report Templates Creation

  • Create templates for customized Test Data Reports ( TDR ). A Template is essential for the TDR.
  • Link the TDR Parameters with Label Data for statical analysis
  • Define mean and Sigma as sub sections for all non-Cpk type sections
  • Add unlimited sections and subsections for each template.
  • Mark/Unmark Outliers for different semiconductor data tests

Test Data Report ( TDR )

  • View TDR to know where your data ( Mean, Median, Sigma, Mean minus 3 sigma, Mean plus 3 sigma, Mean minus 6 sigma, mean plus 6 sigma, Cp, CPK and yield )is heading.
  • View and Edit a TDR's Parameters and their Linking for different statistical analysis.
  • Define new TDR and its Parameter.
  • Link the TDR Parameters with Labels Data individually and collectively.

TDR Customization

  • Copy the TDR with data and linking.
  • Offset the parameters and linking for different data tests.
  • Modify existing TDR Parameter for new statistical analysis.

Histogram Reports

  • The Yield Power ( Semiconductor test Software ) allows you to display the results in the histogram formats to view the statistical analysis results graphically, making it easy to understand.
  • View a histogram of any linking Parameter with a section for online characterization reports.
  • Compare histograms of data from different data sets to compare different semiconductor data test analysis.

Special Histogram Features

  • Classify semiconductor data for histogram creation.
  • Histogram displays bar for each class, specified by the user for semiconductor yield analysis for online characterization reports.
  • The Bars displayed in the histogram depicts number of elements in each class.
  • Customize histograms by defining desired upper and lower limits.

Comparison of Histograms

  • Compare histograms of different data sets.
  • Compare histograms by comparing multiple labels.
  • Comparison labels are customizable. Compare up to twelve labels.
  • Classify data on the basis of lower and upper limits

Export and Print options

  • Generate stand alone web reports in HTML format.
  • Online characterization reports
  • Print the Test Data Reports.

System Requirements

  • Server
  • Windows NT, or 2000
  • SQL Server installed on it
  • 40 GB free Hard Drive Space
  • 1 GB free RAM
  • Client Machines
  • Windows NT, 95, 98, 2000, ME, XP or newer
  • Pentium PC or faster computer with CD-ROM drive
  • 70-90 MB free Hard Drive Space
  • 256 MB free RAM

Architecture

Architecture
Yield Power ( Semiconductor data management software ) is a collaborative data aggregation, collaboration, data analysis, Semiconductor yield management, and web reporting system that enables specifications based monitoring of semiconductor products through high volume production. Yield Power integrates with existing information technology, to collect and distribute semiconductor manufacturing information from a single, scalable data server. And because Yield Power is web-based, users around the world can access data and collaborate on solutions in real-time.

Scalability and performance
Yield Power ( Semiconductor data management software ) was designed to be scalable in order to meet the needs of large fabless semiconductor companies and integrated device manufactures. Powered by Microsoft SQL Server, Yield Power does not have limitations on the number of measurements or parameters collected by the customer. All the uploaded STDF files are saved in the Microsoft SQL Server. The platform's performance and data management limits are set by the deployment hardware platform and network configuration.

Yield Power ( Semiconductor data management software ) clients install on the desktop, and connect to the Internet or Intranet hosted Yield Power ( Semiconductor data management software ) Database Server. This provides secure access to your data, hosted in your premises, or within our secure data center.

Users can work with live data interactively, moving freely among lots, wafer or die-level data while capturing key information or analysis at each step. Engineers can compare lot data to each other by performing analysis directly against the Yield Power ( Semiconductor data management software ) database, and can modify their searches in real time.
Users select data and then navigate and analyze data by clicking on data
points and features of interest as shown in above Figure

Analysis Collaboration
All analyses performed by users can be made available to selected users via the Yield Power ( Semiconductor data management software ) Security module, thus enabling users to effectively share the results with their tea

Analysis and statistics
Yield Power ( Semiconductor testing software ) provides visual and analytical tools to research design and manufacturing problems arising post-design and through to production.

Statistics

  • The Yield Power ( Semiconductor testing software ) platform provides tools to perform the following analysis:
  • Descriptive Statistics
  • ANOVA
  • Cp/Cpk
  • F Test
  • T Test
  • Correlation Analysis
  • Factorial Analysis / Principle Components
  • Lot / Equipment Commonality Analysis
  • Also Yield Power ( Semiconductor testing software ) Perform statistical analysis like Mean, Median, Sigma, Mean minus 3 sigma, Mean plus 3 sigma, Mean minus 6 sigma, mean plus 6 sigma, and yield

Yield Power SQL

Yield Power ( Semiconductor testing software ) SQL version delivers semiconductor test data analysis solution to the Semiconductor Industry. Yield Power SQL is a Client Server Version, with Sql Server installed on the Yield Power Server, and multiple Yield Power Clients connecting to it over the network. This version is specifically for multiple users in a large test team, who require access to data.

Companies, which need fast data access can use Yield Power SQL. Companies of all sizes can have secure and instant access to their semiconductor test data. Yield Power SQL provides completely manageable, convenient, dependable, and safe semiconductor test data analysis system.

Yield Power ( Semiconductor testing software ) SQL has the following key features

  • Flexible Data Entry
  • Stability and Maturity
  • Complete Control over your Semiconductor Test Data
  • Customizable Templates
  • Meaningful Data Analysis and Manipulation
  • Versatile Histograms
  • Convenient Printing and Web Report Exporting

Yield Power.com

Yield Power ( Semiconductor testing software ) introduced the Internet hosted version for the Yield Power called Yield power.com to meet the rapidly increasing demand of web based Data Management.

Companies roaming for a low annual subscription based Data Analysis Service, can use Yield power.com. Companies from small to large size can have secure, cost effective and instant access to the Yield power.com. Yield power.com provides completely convenient, dependable, and safe distinct server based semiconductor test data analysis system without hefty primary investment.

Yield power has provided all the features of Data Analysis System in the Yield power.com to serve the needs of wide range of customers throughout the Semiconductor Industry. Yield power.com grants the customers, access to the Yield power ( Semiconductor testing software ) server, technical support and Yield Power upgrades.

Satisfied Customers

Ease of Use
Yield Power ( Semiconductor data Analysis Software ) is so easy to use that the new user can create first histogram in 5 minutes and mastered most of the functions in just one hour.

Process of Uploading the STDF and other files like CSV is so easy in Yield Power The user can view the uploaded SDTF files data and easily modify the Uploaded STDF files data.

Yield Power saved all the uploaded STDF files and modified data after uploading the STDF files. This functionality of Yield power facilities the user to compare the old and new data for Semiconductor test.

Accuracy
Yield Power turns STDF files into the histograms, the user needs, in just minutes

User can define parameters for Semiconductor test to perform different parameter and parametric tests. So user can get desired statistical analysis.

Yield Power ( Semiconductor data Analysis Software ) provides accurate results for semiconductor Yield Analysis. Comparing of histograms gives the best results to view the variation in Mean, Median, Sigma, Cp, CPK and yield

Efficiency
The ability to export report to HTML files type allows Yield Power to work with any browser.

Yield Power takes few seconds form upload the STDF, ADTF files to Test data reports. It is the best semiconductor data analysis software which reduces the time of semiconductor testing. The Yield Power can calculate Mean, Median, Sigma, Cp, CPK and yield of unlimited data in few min.

Productivity
The Yield Power ( Semiconductor data Analysis Software ) has the ability to create the histogram and report, as the way the user wants it, templates allow the user to quickly reproduce it with additional data sets.
The Yield Power allows the user to graphically removing outliers and recalculates the Semiconductor test. Viewing of Uploaded STDF files data and modification of Uploaded STDF file data is the best functionality of Yield Power


Economy
Yield Power ( Semiconductor data Analysis Software ) is a best product available, the least expensive of the technical semiconductor data analysis applications.


Longevity
Yield Power ( Semiconductor data Analysis Software ) users say that they are using it for more than a year and are pleased with the growth of the program and the prompt technical support whenever needed.

Testimonials

Customer Says, Yield Power ( Semiconductor Yield Improvement Software ) is the best semiconductor data analysis and statistical process control product in the market. Yield Power ( Semiconductor Yield Improvement Software ) is a powerful scientific and statistical tool with best presentation quality for business application.

Customer Says, Yield Power ( Semiconductor Yield Improvement Software )is an outstanding tool for not only visualizing data, statistical process control but analyzing it as well. Yield Power is very intuitive and easy to use.

Customer Says, There is no 'added fat' to this application. You will not come across features that made you think that you will never be able to use this application. On the other hand, when you decided to challenge the program to see if it had some capabilities that you knew other technical charting programs did not have, you will be pleasantly surprised. Yield Power ( Semiconductor Yield Improvement Software ) is executed flawlessly and intuitively.

Customer Says, We prefer Yield Power ( Semiconductor Yield Improvement Software ) for semiconductor data analysis/test over the other ( statistical process control ) available software, because of its simplicity, its spreadsheet-like displays of data labels and seamless integration of screen graphics and printed output. Yield Power perform statistical analysis in seconds after uploading the STDF files.

Customer Says, those of us who believe that the proper implementation of the User Interface precludes is needed to read a manual should be quite pleased with Yield Power ( Semiconductor Yield Improvement Software ), which is simple and very easy to use. Its statistical analysis like Mean, Median, Sigma, Mean minus 3 sigma, Mean plus 3 sigma, Mean minus 6 sigma, mean plus 6 sigma, and yield and graphically presentation of data is accurate and easy to under stand.

Customer Says, with Yield Power semiconductor analysis software has a simple and uncluttered interface which makes it easy to learn.

Customer Says, Yield Power is a fascinating and powerful semiconductor analysis/test program that offers much sophistication yet is incredibly easy to use.

Customer Says, Ten times better than any other product I have tried for the semiconductor data analysis. Its is they best product we prefer for our semiconductor yield improvement.

Customer Says, Both simple and sophisticated calculations are easy to perform. Overall Yield Power is powerful and has an approach and a range of options that make it easy to use.

Customer Says, In over 15 hours of use ( on 3 different platforms ), I didn't experience a single glitch, not one.

Customer Says, I've been using Yield Power since 2001 and it's really been my workhorse. Word, Excel, and Yield Power ( Semiconductor Yield Improvement Software ) are the three productivity applications I use most in my work.

Customer Says, Most flexible import facility ( Yield Power ) can be instructed to upload any number of lines and to read only certain columns of each line

Customer Says, The ability to import STDF ( Standard Test Data Format ) files is extremely valuable for statistical process control.

Customer Says, Many data handling features make YieldPoewr convenient to use. The data import facility allows importing STDF files. Users can even specify the data structure, making data import error free

Customer Says, The ability to create histograms from multiple sets of data spread across multiple data files is one of the most impressive and unique features of Yield Power for us to observe the statistical process control.

Customer Says, Yield Power ( Semiconductor Yield Improvement Software ) lets me choose multiple outlier so I can compare a lot of lines on the same histogram and be able to distinguish them. I can pick and choose the outliers, I think are not needed.
Customer Says, The data selection tool is the most interesting and powerful tool of them all. You can manipulate data of interest and a new histogram is created with only the data selected by the user. Powerful and easy statistical process control software.

Customer Says, "( Yield Power ) outlier marking functions help us clear erroneous data points created by "noise" of test equipment . Yield Power automatically mark the Outliers and we can also mark/unmark outliers manually.